Analysis of surface polyimide composite films with SiO filled by atomic force microscope

  • Abyl Muradov al-Farabi Kazakh National University
  • Anatoliy Kupchishin Kazakh National Pedagogical University Abai, Almaty
DOI: https://doi.org/10.15328/chemb_2013_390-94
Keywords: polyimide composite films, SiO filler, atomic force microscopy

Abstract

By atomic force microscope the morphology of the surface of the polyimide film and the system "Polyimide - SiO filler." was studied.  Irregularities of various sizes are globules of polymer and their compositions with filler particles were visualized on the surface of these polymer systems. As a result of introduction finely dispersed SiO into the filler matrix it was revealed changes of the surface of the polymer composite material. Images obtained in the phase contrast mode allowed to conclude that on the surface of the composite material the larger structural units than ones on the polyimide present.

Author Biography

Anatoliy Kupchishin, Kazakh National Pedagogical University Abai, Almaty
Scientific Research Institute for New Chemical Technologies and Materials

References

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Published
2013-09-14
How to Cite
Muradov, A., & Kupchishin, A. (2013). Analysis of surface polyimide composite films with SiO filled by atomic force microscope. Chemical Bulletin of Kazakh National University, 71(3), 90-94. https://doi.org/https://doi.org/10.15328/chemb_2013_390-94
Issue
Vol 71 No 3 (2013): Chemical Bulletin of Kazakh National University
Section
Organic and Polymers Chemistry
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